TC7WH04FU

Features: • High speed: tpd = 3.8 ns (typ.) at VCC = 5 V• Low power dissipation: ICC = 2 A (max) at Ta = 25°C• High noise immunity: VNIH = VNIL = 28% VCC (min)• 5.5-V Tolerant inputs.• Balanced propagation delays: tpLH −∼ tpHL• Wide operating voltage...

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SeekIC No. : 004515096 Detail

TC7WH04FU: Features: • High speed: tpd = 3.8 ns (typ.) at VCC = 5 V• Low power dissipation: ICC = 2 A (max) at Ta = 25°C• High noise immunity: VNIH = VNIL = 28% VCC (min)• 5.5-V Toleran...

floor Price/Ceiling Price

Part Number:
TC7WH04FU
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High speed: tpd = 3.8 ns (typ.) at VCC = 5 V
• Low power dissipation: ICC = 2 A (max) at Ta = 25°C
• High noise immunity: VNIH = VNIL = 28% VCC (min)
• 5.5-V Tolerant inputs.
• Balanced propagation delays: tpLH −∼ tpHL
• Wide operating voltage range: VCC (opr) = 2~5.5 V



Pinout

  Connection Diagram


Specifications

Characteristics Symbol Ratingh Unit
Power supply viltage VCC −0.5~7.0 V
DC input voltage VIN −0.5~7.0 V
DC output voltage VOUT −0.5~VCC + 0.5 V
Input diode current IIK −20 mA
Output diode current IOK ±20 mA
DC output current IOUT ±25 mA
DC VCC/GND current ICC ±50 mA
Power dissipation PD 300 (TC7WH04FU) mW
200 (TC7WH04FK)
Storage temperature Tstg −65~150 °C
Lead temperature (10 s) TL 260 °C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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