Features: • High speed: tpd = 3.8 ns (typ.) at VCC = 5 V• Low power dissipation: ICC = 2 A (max) at Ta = 25°C• High noise immunity: VNIH = VNIL = 28% VCC (min)• 5.5-V Tolerant inputs.• Balanced propagation delays: tpLH −∼ tpHL• Wide operating voltage...
TC7WH04FU: Features: • High speed: tpd = 3.8 ns (typ.) at VCC = 5 V• Low power dissipation: ICC = 2 A (max) at Ta = 25°C• High noise immunity: VNIH = VNIL = 28% VCC (min)• 5.5-V Toleran...
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Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~7.0 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~VCC + 0.5 | V |
Input diode current | IIK | −20 | mA |
Output diode current | IOK | ±20 | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 300 (TC7WH04FU) | mW |
200 (TC7WH04FK) | |||
Storage temperature | Tstg | −65~150 | °C |
Lead temperature (10 s) | TL | 260 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).