Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.6 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• 5.5-V tolerant inputs• Matches the performance of TC74LCX series when operated at 3.3-V VCCPi...
TC7SZ126AFE: Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.6 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V•...
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Gates (AND / NAND / OR / NOR) 2-Input NAND Gate 5Pin High Speed
• High output drive: ±24 mA (min) at VCC = 3 V
• Super high speed operation: tpd = 2.6 ns (typ.)
at VCC = 5 V, 50 pF
• Operation voltage range: VCC (opr) = 1.8~5.5 V
• 5.5-V tolerant inputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC
Characteristics | Symbol | Rating | Unit |
Power supply voltage DC input voltage DC output voltage |
VCC VIN VOUT |
−0.5~6 −0.5~6 -0.5~VCC + 0.5 |
V V V |
Input diode current Output diode current DC output current DC VCC/ground current |
IIK IOK IOUT ICC |
−20 ±20 ±50 ±50 |
mA mA mA mA |
Power dissipation Storage temperature Lead temperature (10s) |
PD Tstg TL |
150 −65~150 260 |
mW |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (''Handling Precautions''/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).