TC7SZ126AFE

Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.6 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• 5.5-V tolerant inputs• Matches the performance of TC74LCX series when operated at 3.3-V VCCPi...

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SeekIC No. : 004515024 Detail

TC7SZ126AFE: Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.6 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V•...

floor Price/Ceiling Price

Part Number:
TC7SZ126AFE
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High output drive: ±24 mA (min) at VCC = 3 V
• Super high speed operation: tpd = 2.6 ns (typ.)
                                                   at VCC = 5 V, 50 pF
• Operation voltage range: VCC (opr) = 1.8~5.5 V
• 5.5-V tolerant inputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC




Pinout

  Connection Diagram


Specifications

Characteristics Symbol Rating Unit
Power supply voltage

DC input voltage

DC output voltage
VCC

VIN

VOUT
−0.5~6

−0.5~6

-0.5~VCC + 0.5
V

V

V
Input diode current

Output diode current

DC output current

DC VCC/ground current
IIK

IOK

IOUT

ICC
−20

±20

±50

±50
mA

mA

mA

mA
Power dissipation

Storage temperature

Lead temperature (10s)
PD

Tstg

TL
150

−65~150

260
mW




Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (''Handling Precautions''/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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