TC7SZ08FU Selling Leads, Price trend, TC7SZ08FU DataSheet download, circuit diagram from SeekIC.com

Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.7 ns (typ.)at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• 5.5-V tolerant inputs• 5.5-V power down protection outputs• Matches the performance of T...

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SeekIC No. : 004515017 Detail

TC7SZ08FU: Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.7 ns (typ.)at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• ...

TC7SZ08FU Data Sheet

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Part Number:: TC7SZ08FU
Supply Ability:: 5000

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Upload time: 2025/1/12

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Gates (AND / NAND / OR / NOR) 2-Input NAND Gate 5Pin High Speed

Product Details

Description

Features:

• High output drive: ±24 mA (min) at VCC = 3 V
• Super high speed operation: tpd = 2.7 ns (typ.)at VCC = 5 V, 50 pF
• Operation voltage range: VCC (opr) = 1.8~5.5 V
• 5.5-V tolerant inputs
• 5.5-V power down protection outputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC

Pinout

Connection Diagram

Specifications

Characteristics	Symbol	Ratings	Unit
Supply voltage range	V_CC	-0.5~6	V
DC input diode current	I_IN	-0.5~7.0	mA
DC output voltage	V_OUT	−0.5~VCC + 0.5	V
Input diode current	I_IK	-20	mA
Output diode current	I_OK	-20(Note1)	mA
DC output current	I_OUT	±25	mA
DC VCC or ground current per output pin	I_CC	±50	mA
Power dissipation	P_D	50	mW
Lead temperature (10s)	T_L	260
Storage temperature	T_stg	65 to +150

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

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TC7SZ08FU

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