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TC7SZ02AFE

Features: • High output drive: ±24 mA (typ.) @VCC = 3 V• Super high speed operation: tPD 2.4 ns (typ.) @VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• Supply voltage data retention: VCC = 1.5~5.5 V• Latch-up performance: ±500 mA• ESD performan...

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SeekIC No. : 004514999 Detail

TC7SZ02AFE: Features: • High output drive: ±24 mA (typ.) @VCC = 3 V• Super high speed operation: tPD 2.4 ns (typ.) @VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.8~5.5 V• Supp...

TC7SZ02AFE Data Sheet

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Part Number:
TC7SZ02AFE
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• High output drive: ±24 mA (typ.) @VCC = 3 V
• Super high speed operation: tPD 2.4 ns (typ.) @VCC = 5 V, 50 pF
• Operation voltage range: VCC (opr) = 1.8~5.5 V
• Supply voltage data retention: VCC = 1.5~5.5 V
• Latch-up performance: ±500 mA
• ESD performance: Human body model > ±2000 V Machine model > ±200 V
• Power down protection is provided on all inputs.
• Matches the performance of TC74LCX series when operated at 3.3 V VCC
• Input rise and fall time (tr, tf) (recommended operation condition)
@VCC = 1.8 V, 2.5 V ± 0.2 V: 0~20 ns/V
@VCC = 3.3 V ± 0.3 V: 0~10 ns/V
@VCC = 5.5 V ± 0.5 V: 0~5 ns/V


Specifications

Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5~6
V
DC input voltage
VIN
−0.5~6
V
DC output voltage
VOUT
−0.5~VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±50
mA
DC VCC/ground current
ICC
±50
mA
Power dissipation
PD
150
mW
Storage temperature
Lead temperature (10 s)
Tstg
TL
−65~150
260

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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