Features: • High-level output current: IOH/IOL = ±8 mA (min) at VCC = 3.0 V• High-speed operation: tpd = 2.3 ns (typ.) at VCC = 3.3 V,15pF• Operating voltage range: VCC = 0.9~3.6 V• 5.5-V tolerant input.• 3.6-V power down protection outpPinoutSpecifications Chara...
TC7SG34FE: Features: • High-level output current: IOH/IOL = ±8 mA (min) at VCC = 3.0 V• High-speed operation: tpd = 2.3 ns (typ.) at VCC = 3.3 V,15pF• Operating voltage range: VCC = 0.9~3.6 V...
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Gates (AND / NAND / OR / NOR) 2-Input NAND Gate 5Pin High Speed
Characteristics | Symbol | Value | Unit |
Power supply voltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~ 4.6 (Note 1) | V |
−0.5~ VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20(Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/ground current | ICC | ±50 | mA |
Power dissipation | PD | 150 | mW |
Storage temperature | Tstg | −65~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the ignificant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT abusolute maximum rating must be observed.
N ote 3: VOUT < GND