TC7SET34F

Features: • High speed ................................. tpd = 5.0 ns (typ.) at VCC = 5 V• Low power dissipation .............. ICC = 2 A (max) at Ta = 25• Compatible with TTL outputs...VIL = 0.8 V (max.) VIH = 2.0 V (min.)• 5.5V tolerant input. etc).PinoutSpecifications ...

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TC7SET34F Picture
SeekIC No. : 004514909 Detail

TC7SET34F: Features: • High speed ................................. tpd = 5.0 ns (typ.) at VCC = 5 V• Low power dissipation .............. ICC = 2 A (max) at Ta = 25• Compatible with TTL outp...

floor Price/Ceiling Price

Part Number:
TC7SET34F
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High speed ................................. tpd = 5.0 ns (typ.) at VCC = 5 V
• Low power dissipation .............. ICC = 2 A (max) at Ta = 25
• Compatible with TTL outputs...VIL = 0.8 V (max.) VIH = 2.0 V (min.)
• 5.5V tolerant input. etc).



Pinout

  Connection Diagram


Specifications

Characteristics
Symbol
Rating
Unit
Supply Voltage range
VCC
-0.5~7
V
DC Input Voltage
VIN
-0.5~7
V
DC Output Voltage
VOUT
-0.5~VCC+0.5
V
Input Clamp Current
IIK
-20
mA
Output Clamp Current
IOK
±20
mA
DC Output Current
IOUT
±25
mA
DC VCC/ground current
ICC
±50
mA
Power Dissipation
PD
200
mW
Storage Temperature
TSTG
-65 ~ +150
Lead temperature (10 s)
TL
260
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/
          voltage and the significant change in temperature, etc.) may cause this product to decrease in
          the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage,
          etc.) are within the absolute maximum ratings and the operating ranges.

         Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
         Handbook   ("Handling Precautions"/Derating Concept and Methods) and individual reliability data
        (i.e. reliability test report and estimated failure rate, etc).



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