TC7SET17F

Features: • High speed ................................. tpd = 5.0 ns (typ.) at VCC = 5 V• Low power dissipation .............. ICC = 2 A (max) at Ta = 25°C• Compatible with TTL outputs.• 5.5V tolerant input.PinoutSpecifications Characteristics Symbol Rating ...

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SeekIC No. : 004514905 Detail

TC7SET17F: Features: • High speed ................................. tpd = 5.0 ns (typ.) at VCC = 5 V• Low power dissipation .............. ICC = 2 A (max) at Ta = 25°C• Compatible with TTL ou...

floor Price/Ceiling Price

Part Number:
TC7SET17F
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High speed ................................. tpd = 5.0 ns (typ.)
                                                       at VCC = 5 V
• Low power dissipation .............. ICC = 2 A (max)
                                                       at Ta = 25°C
• Compatible with TTL outputs.
• 5.5V tolerant input.



Pinout

  Connection Diagram


Specifications

Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5~7.0
V
DC input voltage
VIN
−0.5~7.0
V
DC output voltage
VOUT
−0.5~VCC + 0.5
V
Input diode current
IIK
-20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±25
mA
DC VCC/ground current
ICC
±50
mA
Power dissipation
PD
200
mW
Storage temperature
Tstg
−65~150
Lead temperature (10 s)
TL
260

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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