Features: • Low voltage operation : VCC = 1.8~3.6 V• High speed operation : tpz = 3.5 ns (max) (VCC = 3.0~3.6 V): tpz = 4.1 ns (max) (VCC = 2.3~2.7 V) : tpz = 8.2 ns (max) (VCC = 1.8 V)• High Output current : IOH/IOL = ±24 mA (min) (VCC = 3.0 V) : IOH/IOL = ±18 mA (min) (VCC = 2....
TC7SA05FU: Features: • Low voltage operation : VCC = 1.8~3.6 V• High speed operation : tpz = 3.5 ns (max) (VCC = 3.0~3.6 V): tpz = 4.1 ns (max) (VCC = 2.3~2.7 V) : tpz = 8.2 ns (max) (VCC = 1.8 V)&...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
US $.05 - .08 / Piece
Gates (AND / NAND / OR / NOR) 2-Input NAND Gate 5Pin High Speed
Characteristics |
Symbol |
Rating |
Unit |
Supply Voltage |
VDD |
−0.5~4.6 |
V |
Input Voltage |
VIN |
−0.5~4.6 |
V |
Output Voltage |
VOUT |
−0.5~4.6 (Note 1) |
V |
Power Dissipation |
IIK |
−50 (Note 2) |
mA |
Output Current |
IOUT |
±50 |
mA |
Power dissipation |
PD |
200 |
mA |
DC VCC/ground current |
ICC |
±100 |
mW |
Storage temperature range |
Tstg |
−65~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: IOUT absolute maximum rating must be observed.
Note 2: VOUT < GND