Features: • High-Speed Switching (CL = 1000pF): 30nsec• High Peak Output Current: 1.5A• High Output Voltage Swing- VDD -25mV- GND +25mV• Low Input Current (Logic 0 or 1 ): 1µA• TTL/CMOS Input Compatible• Available in Inverting and Noninverting Configura...
TC428: Features: • High-Speed Switching (CL = 1000pF): 30nsec• High Peak Output Current: 1.5A• High Output Voltage Swing- VDD -25mV- GND +25mV• Low Input Current (Logic 0 or 1 ):...
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Parameter Name | Value |
Power | Dual |
Peak Output Current (mA) | 1500 |
Output Resistance (RH/RL)(Max. @ 25°C) | 15/10 |
Max. Supply Voltage (V) | 18 |
Input/Output Delay (td1, td2)1 (ns) | 50/75 |
Description | Low-Side MOSFET Drivers, 1.5A Peak Output Current |
Operating Temp. Range (°C) | -40 to 85 |
Supply Voltage.............................................................. +20V
Input Voltage, Any Terminal......... VDD + 0.3V to GND 0.3V
Power Dissipation (TA 70)
PDIP .................................................................. 730mW
CERDIP............................................................... 800mW
SOIC................................................................... 470mW
Derating Factor
PDIP ................................................................... 8mW/
CERDIP............................................................. 6.4mW/
SOIC.................................................................... 4mW/
Operating Temperature Range
C Version.......................................................0 to +70
I Version.................................................... -25 to +85
E Version .................................................. -40 to +85
M Version................................................. -55 to +125
Storage Temperature Range ........................... -65to +150
*Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operation sections of the specifications is not implied. Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability.