TC4001BFN

DC supply voltage V_DD ...............V_SS − 0.5 to V_SS + 20 V
Input voltage V_IN ......................V_SS − 0.5 to V_DD + 0.5 V
Output voltage V_OUT ................V_SS − 0.5 to V_DD + 0.5 V
DC input current I_IN ............................................±10 mA
Power dissipation P_D ..............300 (DIP)/180 (SOIC) mW
Operating temperature range Topr .............−40 to 85
Storage temperature range Tstg ...............−65 to 150
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction.

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

The TC4001BFN is 2-input positive NOR gate, respectively. Since the outputs of these gates are equipped with the buffers, the input/output transmission characteristics have been improved and the variation of transmission time due to an increase in the load capacity is kept minimum.