RTSX32SU

Features:

• Very Low Power Consumption (Up to 68 mW at
Standby)
• 3.3V and 5V Mixed Voltage
• Configurable I/O Support for 3.3V/5V PCI, LVTTL,
TTL, and CMOS
5V Input Tolerance and 5V Drive Strength
Slow Slew Rate Option
Configurable Weak Resistor Pull-Up/Down for
Tristated Outputs at Power-Up
Hot-Swap Compliant with Cold-Sparing
Support
• Secure Programming Technology Prevents Reverse
Engineering and Design Theft
• 100% Circuit Resource Utilization with 100% Pin
Locking
• Unique In-System Diagnostic and Verification
Capability with Silicon Explorer II
• Low-Cost Prototyping Option
• Deterministic, User-Controllable Timing
• JTAG Boundary Scan Testing in Compliance with
IEEE Standard 1149.1 Dedicated JTAG Reset
(TRST) Pin


Specifications

Symbol	Parameter	Limits	Units
VCCI	DC Supply Voltage	0.3 to +6.0	V
VCCA	DC Supply Voltage	0.3 to +3.0	V
VI	Input Voltage	0.5 to + 6.0	V
VI	Input Voltage for Bidirectional I/Os when using 3.3V PCI	0.5 to +VCCI + 0.5	V
TSTG	Storage Temperature	65 to +150

Description

• SEU-Hardened Registers Eliminate the Need to
Implement Triple-Module Redundancy (TMR)
Immune to Single-Event Upsets (SEU) to LETth
> 40 MeV-cm2/mg,
SEU Rate < 1010 Upset/Bit-Day in Worst-Case
Geosynchronous Orbit
• Up to 100 krad (Si) Total Ionizing Dose (TID)
Parametric Performance Supported with Lot-
Specific Test Data
• Single-Event Latch-Up (SEL) Immunity
• TM1019.5 Test Data Available
• QML Certified Devices