Features: • SMD and through-hole versions with ultra low component height 8.0 mm (0.315 in.)• 81% efficiency at full load• 1,500 Vdc isolation voltage• Switching frequency synchronization• MTTF >10 million hours at +50°C case temperature• Low EMIPinoutSpecifi...
PKF4211AI: Features: • SMD and through-hole versions with ultra low component height 8.0 mm (0.315 in.)• 81% efficiency at full load• 1,500 Vdc isolation voltage• Switching frequency sy...
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|
Characteristics |
Min |
Max |
Unit | |
| TC | Case temperature at full output power |
-45 |
+100 |
°C |
| TS | Storage temperature |
-55 |
+125 |
°C |
| VI | Continuous input voltage1) |
-0.5 |
+80 |
Vdc |
| VISO | Isolation voltage (input to output test voltage) |
1,500 |
Vdc | |
| Etr | Transient input energy |
0.01 |
Ws | |
| VRC | Remote control voltage pin 11 ref. to pin 17 |
-5 |
+16 |
Vdc |
| Vadj | Output adjust voltage pin 8 ref. to pin 17 |
-5 |
+40 |
Vdc |
Stress in excess of Absolute Maximum Ratings may cause permanent damage.Absolute Maximum Ratings, sometimes
referred to as no destruction limits, are normally tested with one parameter at a time exceeding the limits of Output data or Electrical Characteristics. If exposed to stress above these limits, function and performance may degrade in an unspecified manner.