PEB2085

Features: ·Full duplex 2B + D S/T interface transceiver according to CCITT I.430·Conversion of the frame structure between the S/T interface and IOM·Receive timing recovery according to selected operating mode·D-channe·access control·Activation and deactivation procedures, with automatic wake-up f...

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PEB2085 Picture
SeekIC No. : 004457996 Detail

PEB2085: Features: ·Full duplex 2B + D S/T interface transceiver according to CCITT I.430·Conversion of the frame structure between the S/T interface and IOM·Receive timing recovery according to selected ope...

floor Price/Ceiling Price

Part Number:
PEB2085
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/25

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Product Details

Description



Features:

·Full duplex 2B + D S/T interface transceiver according to CCITT I.430
·Conversion of the frame structure between the S/T interface and IOM
·Receive timing recovery according to selected operating mode
·D-channe·access control
·Activation and deactivation procedures, with automatic wake-up from power-down state
·Access to S and Q bits of S/T interface
·Adaptively switched receive thresholds
·Frame alignment with absorption of phase wander in NT2 network side applications
·Support of LAPD protocol
·FIFO buffer (2 ´ 64 bytes) for efficient transfer of D-channel packets
·8-bit microprocessor interface, multiplexed or non-multiplexed
·Serial interfaces: IOM-1, SLD, SSI IOM-2
·Implementation of IOM-1/IOM-2 MONITOR and C/I channel protocol to control peripheral devices
·mP access to B-channels and intercommunication channels
·B-channel switching
·Watchdog timer
·Test loops
·Advanced CMOS technology
·Low power consumption: standby 8 mW active 80 mW




Pinout

  Connection Diagram


Specifications

Parameter Symbol Limit Values Unit
Voltage on any pin
with respect to ground
VS 0.4 to VDD + 0.4 V
Ambient temperature under bias TA 0 to 70 °C
Storage temperature Tstg 65 to 125 °C
Maximum voltage on V DD VDD 6 V
Note: Stresses above those listed here may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.



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