NUP2105L

Features: • 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)• Low Reverse Leakage Current (< 100 nA)• Low Capacitance High−Speed CAN Data Rates• IEC Compatibility:− IEC 61000−4−2 (ESD): Level 4 − IEC 61000−4−4...

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SeekIC No. : 004436739 Detail

NUP2105L: Features: • 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)• Low Reverse Leakage Current (< 100 nA)• Low Capacitance High−Speed CAN Data Rates• IEC Compa...

floor Price/Ceiling Price

Part Number:
NUP2105L
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

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Upload time: 2024/11/21

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Product Details

Description



Features:

• 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)
• Low Reverse Leakage Current (< 100 nA)
• Low Capacitance High−Speed CAN Data Rates
• IEC Compatibility:− IEC 61000−4−2 (ESD): Level 4
− IEC 61000−4−4 (EFT): 40 A 5/50 ns
− IEC 61000−4−5 (Lighting) 8.0 A (8/20 s)
• ISO 7637−1, Nonrepetitive EMI Surge Pulse 2, 9.5 A (1 x 50 s)
• ISO 7637−3, Repetitive Electrical Fast Transient (EFT) EMI Surge Pulses, 50 A (5 x 50 ns)
• Flammability Rating UL 94 V−0
• Pb−Free Packages are Available



Application

• Industrial Control Networks
Smart Distribution Systems (SDSTM)
DeviceNetTM
• Automotive Networks
Low and High−Speed CAN
Fault Tolerant CAN



Pinout

  Connection Diagram


Specifications

Symbol
Rating
Value
Unit
PPK
Peak Power Dissipation
8 x 20 s Double Exponential Waveform (Note 1)

350
W
TJ
Operating Junction Temperature Range
−40 to 125
°C
TJ
Storage Temperature Range
−55 to 150
°C
TL
Lead Solder Temperature (10 s)
260
°C
ESD
Human Body model (HBM)
Machine Model (MM)
IEC 61000−4−2 Specification (Contact)
16
400
30
kV
V
kV

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Non−repetitive current pulse per Figure 1.



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