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NL17SZ00

Features: • Tiny SOT−353 and SOT−553 Packages• 2.7 ns TPD at 5 V (typ)• Source/Sink 24 mA at 3.0 V• Over−Voltage Tolerant Inputs• Pin For Pin with NC7SZ00P5X, TC7SZ00FU and TC7SZ00AFE• Chip Complexity: FETs = 20• Designed for 1.65 V to 5....

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SeekIC No. : 004434680 Detail

NL17SZ00: Features: • Tiny SOT−353 and SOT−553 Packages• 2.7 ns TPD at 5 V (typ)• Source/Sink 24 mA at 3.0 V• Over−Voltage Tolerant Inputs• Pin For Pin with NC7...

NL17SZ00 Data Sheet

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Part Number:
NL17SZ00
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• Tiny SOT−353 and SOT−553 Packages
• 2.7 ns TPD at 5 V (typ)
• Source/Sink 24 mA at 3.0 V
• Over−Voltage Tolerant Inputs
• Pin For Pin with NC7SZ00P5X, TC7SZ00FU and TC7SZ00AFE
• Chip Complexity: FETs = 20
• Designed for 1.65 V to 5.5 V VCC Operation
• Pb−Free Packages are Available


Pinout

Connection Diagram


Specifications

Symbol Parameter Value Unit
VCC DC Supply Voltage -0.5 to +7.0 V
VI DC Input Voltage -0.5 to +7.0 V
VO DC Output Voltage Output in Higher or Low State (Note 1) −0.5 to VCC +0.5 V
IIK DC Input Diode Current VI < GND ±50 mA
IOK DC Output Diode Current VO = GND
VO = VCC		 −50
+50
 mA
IOU DC Output Sink Current ±50 mA
ICC DC Supply Current per Supply Pin ±50 mA
IGND DC Ground Current per Ground Pin ±50 mA
TSTG Storage Temperature Range −65 to +150 °C
TL Lead Temperature, 1 mm from Case for 10 Seconds 260 °C
TJ Junction Temperature Under Bias +150 °C
JA Thermal Resistance SOT- 353 (Note 1)
SOT- 553		 350
496		 °C/W
PD Power Dissipation in Still Air at 85°C SOT−353
SOT−553		 186
135		 mW
MSL Moisture Sensitivity Level 1  
FR Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in  
ESD ESD Classification Human Body Model (Note 4)
Machine Model (Note 5)
Charge Device Model (Note 6)		 Class IC
Class A
N/A
 V
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
3. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.


Description

The NL17SZ00 is a single 2−input NAND Gate in two tiny footprint packages. The device performs much as LCX multi−gate products in speed and drive.




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