Features: • LOW NOISE FIGURE NF = 1.6 dB TYP at f = 12 GHz• HIGH ASSOCIATED GAIN GA = 9 dB TYP at f = 12 GHz• LG = 0.3 mm, WG = 280 mm• LOW COST METAL/CERAMIC PACKAGE• ION IMPLANTATION• AVAILABLE IN TAPE & REELSpecifications SYMBOLS PARAMETERS U...
NE76084S: Features: • LOW NOISE FIGURE NF = 1.6 dB TYP at f = 12 GHz• HIGH ASSOCIATED GAIN GA = 9 dB TYP at f = 12 GHz• LG = 0.3 mm, WG = 280 mm• LOW COST METAL/CERAMIC PACKAGE• ...
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SYMBOLS |
PARAMETERS |
UNITS |
RATINGS |
VDS |
Drain to Supply Voltage |
V |
5 |
VGS |
Gate to Drain Voltage |
V |
-5 |
VGS |
Gate to Source Voltage |
V |
-3 |
IDS |
Drain Current |
mA |
IDSS |
PIN |
RF Input (CW) |
dBm |
+15 |
PT2 |
Total Power Dissipation |
mW |
240 |
TCH |
Channel Temperature |
°C |
175 |
TSTG |
Storage Temperature |
°C |
-65 to +175 |
The NE76084S provides a low noise figure and high associated gain through 14 GHz. The NE76084S device is fabricated by ion implantation for improved RF and DC performance, reliability, and uniformity. The device features a recessed 0.3 micron gate and triple epitaxial technology.
NEC's NE76084S stringent quality assurance and test procedures assure the highest reliability and performance.