Features: • Semiconductor wafer inspection• Real time fluorescence observation• Biochemical emission imaging• Biophoton imagingApplication• Semiconductor wafer inspection• Real time fluorescence observation• Biochemical emission imaging• Biophoton im...
N7220: Features: • Semiconductor wafer inspection• Real time fluorescence observation• Biochemical emission imaging• Biophoton imagingApplication• Semiconductor wafer inspecti...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
• Semiconductor wafer inspection
• Real time fluorescence observation
• Biochemical emission imaging
• Biophoton imaging
Parameter |
N7640 |
N7220 |
Unit |
Focusing Method |
Proximity-focused |
Proximity-focused |
- |
Window Material |
Synthetic silica |
Synthetic silica |
- |
Photocathode |
Multialkali |
Multialkali |
- |
Maximum Supply Voltage |
-6 |
-8 |
kV |
Gain (Typ.)*2 |
700 |
1300 |
- |
Limiting Resolution (Typ.) |
400 |
450 |
TV lines |
Effective Area (H5V) |
9.2*6.8 |
12.2 *12.2 |
mm |
Poly Oxy Methylene (POM) |
Poly Oxy Methylene (POM) |
Poly Oxy Methylene (POM) |
- |
Lead Wire Sheath |
Teflon |
Teflon |
- |
Dimension |
53 5 16.5 (excluding lead pins) |
53 5 16.5 (excluding lead pins) |
mm |