Features: SpecificationsDescriptionThe MX7578 is a complete,calibrated 12-bit A/D converter (ADC) which includes a conversion clock.Internal calibration circuitry maintains true 12-bit performance over the full operating temperature range without external adjustments.In addition,each conversion in...
MX7578: Features: SpecificationsDescriptionThe MX7578 is a complete,calibrated 12-bit A/D converter (ADC) which includes a conversion clock.Internal calibration circuitry maintains true 12-bit performance o...
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The MX7578 is a complete,calibrated 12-bit A/D converter (ADC) which includes a conversion clock.Internal calibration circuitry maintains true 12-bit performance over the full operating temperature range without external adjustments.In addition,each conversion includes an auto-zero cycle which reduces zero error to typically below 100V.
The MX7578 has some absolute maximum ratings.When parameter is VDD to DGND,the rating is -0.3V,+17V.When parameter is VSS to DGND,the rating is +0.3V,-7V.When parameter is AGND to DGND,the rating is -0.3V,REFIN+0.3V.When parameter is VCC to DGND,the rating is -0.3V,+7V.When parameter is REFIN to AGND,the rating is -0.3V,VDD+0.3V.When parameter is AIN0-AIN3 to AGND,the rating is -0.3V,VDD+0.3V.When parameter is digital input voltage to DGND,the rating is -0.3V,VDD+0.3V.When parameter is digital output voltage to DGND,the rating is -0.3V,VDD+0.3V.When parameter is power dissipation (any package) to +75,the rating is 1000mW.When parameter is power dissipation (any package) derate above +75 by,the rating is 10W/.When parameter is storage temperature range,the rating is -65 to +150.When parameter is lead temperature (soldering,10sec),the rating is 300.
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device.These are stress ratings only,and functional operation of the MX7578 at these or any other conditions beyond those indicated in the operational sections of specifications is not implied.Exposure to absolute maximum rating conditions for extended periods may affect device reliability.