MX7545A

Features: SpecificationsDescriptionThe MX7545A and MAX7645, 12-bit CMOS multiplying digital-to-analog converters (DAC) with internal data latches,are improved versions of the industry standard MX7545.The MX7545A features a 100ns max write pulse with (150ns for MAX7645) which allows interfacing to ...

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SeekIC No. : 004431832 Detail

MX7545A: Features: SpecificationsDescriptionThe MX7545A and MAX7645, 12-bit CMOS multiplying digital-to-analog converters (DAC) with internal data latches,are improved versions of the industry standard MX754...

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Part Number:
MX7545A
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/26

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Product Details

Description



Features:






Specifications






Description

The MX7545A and MAX7645, 12-bit CMOS multiplying digital-to-analog converters (DAC) with internal data latches,are improved versions of the industry standard MX7545.The MX7545A features a 100ns max write pulse with (150ns for MAX7645) which allows interfacing to a wide range of fast 8 and 16-bit microprocessors.

The MX7545A and MAX7645 have some absolute maximum ratings.When parameter is VDD to DGND,the rating is -0.3V,+17V.When parameter is digital input voltage to DGND,the rating is -0.3V,VDD+0.3V.When parameter is VRFB,VREF to DGND,the rating is ±25V.When parameter is out1 to DGND,the rating is -0.3V,VDD+0.3V.When parameter is AGND to DGND,the rating is -0.3,VDD+0.3V.When parameter is power dissipation (any package) to +75,the rating is 450mW.When parameter is power dissipation (any package) derate above +75 by,the rating is 6W/.When parameter is storage temperature range,the rating is -65 to +150.When parameter is lead temperature (soldering,10sec),the rating is +300.

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device.These are stress ratings only,and functional operation of the MX7545A at these or any other conditions beyond those indicated in the operational sections of specifications is not implied.Exposure to absolute maximum rating conditions for extended periods may affect device reliability.






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