Features: • 524,288 x 8 only• Single power supply operation- 5.0V only operation for read, erase and program operation• Fast access time: 70/90/120ns• Low power consumption- 30mA maximum active current(5MHz)- 1uA typical standby current• Command register architecture-...
MX29F004T: Features: • 524,288 x 8 only• Single power supply operation- 5.0V only operation for read, erase and program operation• Fast access time: 70/90/120ns• Low power consumption- ...
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Features: SpecificationsDescription The MX29F001T/B is a 1-mega bit Flash memory organized as 128K...
The MX29F004T/B is a 4-mega bit Flash memory organized as 512K bytes of 8 bits. MXIC's Flash memories offer the most cost-effective and reliable read/ write non-volatile random access memory. The MX29F004T/B is packaged in 32-pin PLCC, TSOP, PDIP. It is designed to be reprogrammed and erased in system or in standard EPROM programmers. The standard MX29F004T/B offers access time as fast as 70ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX29F004T/B has separate chip enable (CE) and output enable (OE ) controls. MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and programming. The MX29F004T/B uses a command register to manage this functionality.
The command register allows for 100% TTL level control inputs and fixed power supply levels during erase and programming, while maintaining maximum EPROM compatibility. MXIC Flash technology reliably stores memory contents even after 100,000 erase and program cycles.
The MXIC cell is designed to optimize the erase and programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and program operations produces reliable cycling. The MX29F004T/B uses a 5.0V±10% VCC supply to perform the High Reliability Erase and auto Program/Erase algorithms. The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC + 1V.