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MSRD620CT

Rectifiers 200V 6A Ultrasoft

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SeekIC No. : 00182862 Detail

MSRD620CT: Rectifiers 200V 6A Ultrasoft

MSRD620CT Data Sheet

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Part Number:
MSRD620CT
Mfg:
ON Semiconductor
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/24

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Product Details

Quick Details

Product : Ultra Fast Recovery Rectifiers Configuration : Dual Common Cathode
Reverse Voltage : 200 V Forward Voltage Drop : 1.35 V
Recovery Time : 55 ns Forward Continuous Current : 6 A
Max Surge Current : 50 A Reverse Current IR : 5 uA
Mounting Style : SMD/SMT Package / Case : DPAK
Packaging : Tube    

Description

Product : Ultra Fast Recovery Rectifiers
Mounting Style : SMD/SMT
Package / Case : DPAK
Reverse Voltage : 200 V
Reverse Current IR : 5 uA
Packaging : Tube
Max Surge Current : 50 A
Forward Continuous Current : 6 A
Forward Voltage Drop : 1.35 V
Configuration : Dual Common Cathode
Recovery Time : 55 ns


Features:

• Pb−Free Packages are Available
• Soft Ultrafast Recovery (35 ns typ)
• Highly Stable Oxide Passivated Junction
• Matched Dual Die Construction − May Be Paralleled for High Current Output
• Short Heat Sink Tab Manufactured − Not Sheared
• Epoxy Meets UL 94 V−O @ 0.125 in.


Specifications

Rating Symbol Value Unit
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage		 VRRM
VRWM
VR		 200 V
Average Rectified Forward Current
  (At Rated VR, TC = 137°C)           Per Leg
                                                    Per Package		 IO 3.0
6.0		 A
Peak Repetitive Forward Current
  (At Rated VR, Square Wave, 20 kHz, TC = 138°C)     Per Leg		 IFRM 6.0 A
Non−Repetitive Peak Surge Current                        Per Package
(Surge Applied at Rated Load Conditions, Halfwave, Single Phase, 60 Hz)		 IFSM 50 A
Storage / Operating Case Temperature Tstg, Tc −55 to +175 °C
Operating Junction Temperature TJ −55 to +175 °C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and reliability may be affected.


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