DescriptionThe MSC23108CL-60DS2 belongs to OKI MSC23108C/CL-xxDS2 family which is a fully decoded 1,048,576-word x 8-bit CMOS dynamic random accessmemory module composed of two 4-Mb DRAMs 1M x 4) in SOJ packages mounted with two decoupling capacitors on a 30-pin glass epoxy single-inline package. ...
MSC23108CL-60DS2: DescriptionThe MSC23108CL-60DS2 belongs to OKI MSC23108C/CL-xxDS2 family which is a fully decoded 1,048,576-word x 8-bit CMOS dynamic random accessmemory module composed of two 4-Mb DRAMs 1M x 4) in...
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Specifications Rating Symbol Value Unit CollectorBase Voltage V(BR)CBO 30 Vdc Col...
The MSC23108CL-60DS2 belongs to OKI MSC23108C/CL-xxDS2 family which is a fully decoded 1,048,576-word x 8-bit CMOS dynamic random accessmemory module composed of two 4-Mb DRAMs 1M x 4) in SOJ packages mounted with two decoupling capacitors on a 30-pin glass epoxy single-inline package. This module is generally used for non-parity memory expansion applications such as fax machines, printers and personal computers. The low-powerversion (CL) offers reduced power consumption for mobile computing applications like laptops and palmtops.
The features of MSC23108CL-60DS2 can be summarized as (1)1-meg 8-bit organization; (2)30-pin socket insertable module MSCZBIOBC/CL-xxDS2 : solder tab; (3)single 5V supply ±10% tolerance; (4)access times: 60, 70, 80 ns; (5)input: TTL compatible; (6)output : compatible, 3-state; (7)refresh : 1024 cycles/16 ms (128 ms: L-version); (8)CAS before RAS refresh, CAS before RAS hidden refresh, RAS-only refresh capability; (9)multi-bit test mode capability; (10)fast page made capability.
The absolute maximum ratings of MSC23108CL-60DS2 are (1)voltage on any pin relative to VSS VIN, VOUT: -1.0 to 7.0V; (2)voltage VCC supply relative to VSS VCC: -1.0 to 7.0V; (3)short circuit outpput current IOS: 50mA; (4)power dissipation PD: 2W; (5)operating temperature Topr: 0 to 70 °C; (6)storage temperature Tstg: -40 to 125°C.(Note: Permanent device damage may occur if absolute maximum ratings are exceeded. functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability).