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MC74LVX132

Features: • High Speed: tPD = 5.8 ns (Typ) at VCC = 3.3 V• Low Power Dissipation: ICC = 2 A (Max) at TA = 25°C• Power Down Protection Provided on Inputs• Low Noise: VOLP = 0.5 V (Max)• Pin and Function Compatible with Other Standard Logic Families• Latchup Perfo...

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MC74LVX132: Features: • High Speed: tPD = 5.8 ns (Typ) at VCC = 3.3 V• Low Power Dissipation: ICC = 2 A (Max) at TA = 25°C• Power Down Protection Provided on Inputs• Low Noise: VOLP = 0....

MC74LVX132 Data Sheet

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Part Number:
MC74LVX132
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• High Speed: tPD = 5.8 ns (Typ) at VCC = 3.3 V
• Low Power Dissipation: ICC = 2 A (Max) at TA = 25°C
• Power Down Protection Provided on Inputs
• Low Noise: VOLP = 0.5 V (Max)
• Pin and Function Compatible with Other Standard Logic Families
• Latchup Performance Exceeds 300 mA
• ESD Performance: Human Body Model > 2000 V; Machine Model > 200 V
• Pb−Free Packages are Available*


Pinout

Connection Diagram


Specifications

Symbol
Parameter
Value
Unit
VCC
Supply Voltage
-0.5 to +7.0
V
VI
DC Input Voltage
-0.5 to +7.0
V
VO
DC output Voltage
-0.5 to VCC + 0.5
V
VIK
DC Input Diode Current
- 20
mA
IOK
DC Output Diode Current
± 20
mA
IO
DC Output Current
± 25
mA
ICC or IGND
DC VCC or Ground Current
± 50
mA
ID
Power Dissipation
180
mW
Tstg
Storage Temperature
-65 to +150
°C
TL
Lead Temperature (10 sec)
300
°C
TJ
Junction Temperature under Bias
+150
°C
JA
Thermal Resistance
SOIC
TSSOP
250
oC/W
PD
Power Dissipation in Still Air at 85oC
SOIC
TSSOP
250
mW
MSL
Moisture Sensitivity
Level 1

FR
Flammability Rating Oxygen Index: 30% − 35%
UL 94−V0 @ 0.125 in

VESD
ESD Withstand Voltage
Human Body Model (Note 1)
Machine Model (Note 2)
Charged Device Model (Note 3)
> 2000
> 200
N/A
V
ILatchup
Latchup Performance Above VCC and Below GND at 85oC (Note 4)
±300
mA


Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Tested to EIA/JESD22−A114−A.
2. Tested to EIA/JESD22−A115−A.
3. Tested to JESD22−C101−A.
4. Tested to EIA/JESD78.




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