MC33063

The MC33063 series are optically coupled isolators consisting of a Gallium Arsenide infrared emitting diode coupled with a light activated silicon bilateral switch perform- ing the functions of a triac mounted in a standard 6 pin dual-in-line package. This is not an extensive capacitor list. Capacitors from other vendors are available with comparable specifications. Those listed are for guidance. The RMS ripple current rating and ESR (Equivalent Series Resistance at 100kHz) are critical parameters necessary to insure both optimum regulator performance and long capacitor life.

Although the MC33063 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. The proper and correct applications of products and data is the responsibility of the user. Statements of recommendations not contained herein shall have no force or effect unless embodied in a written agreement signed by authorized officers of Desco Industries, Inc.Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and  functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not  implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

Information about MC33063 contained in this publication regarding device applications and the like is intended through suggestion only and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications.No representation or warranty is given and no liability is assumed by Microchip Technology Incorporated with respect to the accuracy or use of such information, or infringement of patents or other intellectual property rights arising from such use or otherwise. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample   and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of   a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.