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MBRS240LT3

Schottky (Diodes & Rectifiers) 2A 40V Low Vf

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SeekIC No. : 00194659 Detail

MBRS240LT3: Schottky (Diodes & Rectifiers) 2A 40V Low Vf

MBRS240LT3 Data Sheet

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Part Number:
MBRS240LT3
Mfg:
ON Semiconductor
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/27

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Product Details

Quick Details

Product : Schottky Diodes Peak Reverse Voltage : 40 V
Forward Continuous Current : 2 A Max Surge Current : 25 A
Configuration : Single Forward Voltage Drop : 0.54 V at 4 A
Maximum Reverse Leakage Current : 2000 uA Operating Temperature Range : - 55 C to + 125 C
Mounting Style : SMD/SMT Package / Case : SMB
Packaging : Reel    

Description

Recovery Time :
Maximum Power Dissipation :
Configuration : Single
Mounting Style : SMD/SMT
Product : Schottky Diodes
Operating Temperature Range : - 55 C to + 125 C
Packaging : Reel
Maximum Reverse Leakage Current : 2000 uA
Package / Case : SMB
Max Surge Current : 25 A
Peak Reverse Voltage : 40 V
Forward Continuous Current : 2 A
Forward Voltage Drop : 0.54 V at 4 A


Features:

• Compact Package with J−Bend Leads Ideal for Automated Handling
• Highly Stable Oxide Passivated Junction
• Guard−Ring for Overvoltage Protection
• Low Forward Voltage Drop
• Pb−Free Package is Available


Specifications

Parameter Symbol
Value
 Unit
Repetitive peak reverse voltage VRRM
30
 V
Working peak reverse voltage VRWM
30
 V
DC blocking voltage VR
30
V
Average Rectified Forward Current
(At Rated VR, TC = 100°C)		 IO 2.0 A
Peak Repetitive Forward Current
(At Rated VR, Square Wave,
100 kHz, TC = 105°C)		 IFRM
4.0		 A
Nonrepetitive Peak Surge Current
(Surge applied at rated load conditions halfwave, single phase, 60 Hz)		 IFSM 25 A
Storage/Operating Case
Temperature		 Tstg, TC 55 to +150 °C
Operating Junction Temperature TJ 55 to +125 °C
Voltage Rate of Change
(Rated VR, TJ = 25°C)		 dv/dt 10,000 V/s

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.




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