M28LV64

PinoutSpecifications Symbol Parameter Value Unit TA Ambient Operating Temperature 40 to 85 °C TSTG Storage Temperature Range 65 to 150 °C VCC Supply Voltage 0.6 to 6.5 V VIO Input or Output Voltages 0.3 to VCC +0.6 V VI Inp...

product image

M28LV64 Picture
SeekIC No. : 004404301 Detail

M28LV64: PinoutSpecifications Symbol Parameter Value Unit TA Ambient Operating Temperature 40 to 85 °C TSTG Storage Temperature Range 65 to 150 °C VCC Supply V...

floor Price/Ceiling Price

Part Number:
M28LV64
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

SeekIC Buyer Protection PLUS - newly updated for 2013!

  • Escrow Protection.
  • Guaranteed refunds.
  • Secure payments.
  • Learn more >>

Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/11/27

Payment Methods

All payment methods are secure and covered by SeekIC Buyer Protection PLUS.

Notice: When you place an order, your payment is made to SeekIC and not to your seller. SeekIC only pays the seller after confirming you have received your order. We will also never share your payment details with your seller.
Product Details

Description



Pinout

  Connection Diagram


Specifications

Symbol
Parameter
       Value
Unit
TA
Ambient Operating Temperature
40 to 85
°C
TSTG
Storage Temperature Range
65 to 150
°C
VCC
Supply Voltage
0.6 to 6.5
V
VIO
Input or Output Voltages
0.3 to VCC +0.6
V
VI
Input Voltage
0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model) (2)
4000
V



Description

The M28LV64 is an 8K x 8 low power Parallel EEPROM fabricated with SGS-THOMSON proprietary single polysilicon CMOS technology. The device offers fast access time with low power dissipation and requires a 2.7V to 3.6V power supply.




Customers Who Bought This Item Also Bought

Margin,quality,low-cost products with low minimum orders. Secure your online payments with SeekIC Buyer Protection.
Cables, Wires - Management
Line Protection, Backups
RF and RFID
Test Equipment
View more