LT1027

Features:

Very Low Drift: 2ppm/°C Max TC
Pin Compatible with LT1021-5, REF-02, (TO-5 and PDIP Packages Only)
Output Sources 15mA, Sinks 10mA
Excellent Transient Response Suitable for A-to-D Reference Inputs
Noise Reduction Pin
Excellent Long Term Stability
Less Than 1ppm P-P Noise (0.1Hz to 10Hz)


Application

A-to-D and D-to-A Converters
Digital Voltmeters
Reference Standard
Precision Current Source


Pinout




Specifications

Supply Voltage (VIN) ............................................... 40V
Input-Output Voltage Differential ............................ 35V
Output to Ground Voltage ......................................... 7V
VTRIM to Ground Voltage
    Positive ................................................................ 5V
    Negative .......................................................... 0.3V
Output Short-Circuit Duration
    VIN > 20V ........................................................ 10 sec
    VIN £ 20V ................................................... Indefinite
Operating Temperature Range
    LT1027C ................................................ 0°C to 70°C
    LT1027M ......................................... 55°C to 125°C
Storage Temperature Range
    All Devices ....................................... 65°C to 150°C
Lead Temperature (Soldering, 10 sec)................. 300°C



Description

The LT®1027 is a precision reference with extra-low drift, superior accuracy, excellent line and load regulation and
low output impedance at high frequency. This device is intended for use in 12- to 16-bit A-to-D and D-to-A systems where demanding accuracy requirements must be met without the use of power hungry, heated substrate
references. The fast settling output recovers quickly from load transients such as those presented by A-to-D converter
reference inputs. The LT1027 brings together both outstanding accuracy and temperature coefficient specifications.

The LT1027 reference is based on LTC's proprietary advanced subsurface Zener bipolar process which eliminates noise and stability problems associated with surface breakdown devices.