Features: ·5 pin micro SMD Package
·6 pin LLP Package
·Stable with Ceramic Capacitor
·Logic Controlled Enable
·Fast Turn-on
·Thermal-overload and short-circuit protection
·−40 to +125°C junction temperature range for operationApplication·GSM Portable Phones
·CDMA Cellular Handsets
·Wideband CDMA Cellular Handsets
·Bluetooth Devices
·Portable Information Appliances
·Handheld MP3 DevicesSpecifications
| Output Current |
150 mA |
| Output Min |
1.8, 2.4, 2.5, 3.3, 2.8, 1.5 Volt |
| Input Min Voltage |
2.5 Volt |
| Input Max Voltage |
6 Volt |
| Dropout Voltage |
0.06 Volt |
| Adjustable Output |
No |
| Quiescent Current |
0.085 mA |
| PSRR |
60 dB |
| Voltage Noise (rms) |
30 uV |
| On/Off Pin |
Yes |
| Error Flag |
No |
| RegType |
LDO |
| Temperature Min |
-40 deg C |
| Temperature Max |
125 deg C |
| Output Voltage |
1.8, 2.4, 2.5, 3.3, 2.8, 1.5 Volt |
| Output Max |
1.8, 2.4, 2.5, 3.3, 2.8, 1.5 Volt |
| View Using Catalog |
Input Voltage (VIN) ............−0.3 to 6.5V
Output Voltage . −0.3 to (VIN + 0.3V)to 6.5V (max)
Enable Input Voltage .......... −0.3 to 6.5V
Junction Temperature .............. 150°C
Lead/Pad Temperature
(Note 5)
LLP ......................... 235°C
microSMD ......................260°C
Storage Temperature .........−65 to +150°C
Continuous Power Dissipation...Internally limited
(Note 6)
ESD (Note 9)
Human Body Model ................. 2 kV
Machine Model ................... 200V
DescriptionThe LP3999 regulator is designed to meet the requirements of portable wireless battery-powered applications and will provide an accurate output voltage with low noise and low quiescent current. Ideally suited for powering RF/Analog devices this device will also be used to meet more general circuit requirements.
For battery powered applications the low dropout and low ground current provided by the device allows the lifetime of the battery to be maximized.The inclusion of an Enable(disable) control can be used by the system to further extend the battery lifetime by reducing the power consumption to virtually zero. Should the application require a device with an active disable function please refer to device LP3995.
The LP3999 also features internal protection against short-circuit currents and over-temperature conditions.
The LP3999 is designed to be stable with small 1.0 µF ceramic capacitors. The small outline of the LP3999 micro SMD package with the required ceramic capacitors can realize a system application within minimal board area.
Performance is specified for a -40°C to +125°C temperature range.
The device is available in micro SMD package. For other package options contact your local NSC sales office.
The device is available in fixed output voltages in the ranges of 1.5V to 3.3V. For availability, please contact your local NSC sales office.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
| LP3999ITL-1.5 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-1.8 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-1875 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-2.4 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-2.5 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-2.8 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITL-3.3 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-1.5 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-1.8 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-1875 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-2.4 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-2.5 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-2.8 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
| LP3999ITLX-3.3 |
CMOS7 |
0 |
16561 |
0 |
0 |
954000 |
4 |
270700104 |
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.For more information on Reliability Metrics, please click here.
More Application Notes
| Title |
Size in Kbytes |
Date |
|
| AN-1342: Application Note 1342 LP3994 microSMD Evaluation Board Information |
79 Kbytes |
13-Oct-04 |
Download |
| AN-1416: Application Note 1416 LP3991TL micro SMD Evaluation Board Information |
1212 Kbytes |
11-Mar-07 |
Download |
AN-1416 (Chinese): Application Note 1416 LP3991TL micro SMD Evaluation Board Information
|
210 Kbytes |
|
640){this.height=this.height*640/this.width;this.width=640;}' border="0" alt=" Connection Diagram"> |
| AN-1377: Application Note 1377 LP3996 / LP5996 Application Board Information |
514 Kbytes |
3-Nov-06 |
Download |
AN-1377 (Chinese): Application Note 1377 LP3996 / LP5996 Application Board Information
|
232 Kbytes |
|
640){this.height=this.height*640/this.width;this.width=640;}' border="0" alt=" Connection Diagram"> |
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|
LP3999 Data Sheet
