LF298

SpecificationsTemperature Min-25 deg CTemperature Max85 deg COffset Voltage max, 25C5 mV View Using CatalogDescriptionThe LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate. O...

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SeekIC No. : 004393736 Detail

LF298: SpecificationsTemperature Min-25 deg CTemperature Max85 deg COffset Voltage max, 25C5 mV View Using CatalogDescriptionThe LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-F...

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Part Number:
LF298
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/21

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Product Details

Description



Specifications

Temperature Min-25 deg C
Temperature Max85 deg C
Offset Voltage max, 25C5 mV
View Using Catalog



Description

The LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate. Operating as a unity gain follower, dc gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does not degrade input offset drift. The wide bandwidth allows the LF198 to be included inside the feedback loop of 1 MHz op amps without having stability problems. Input impedance of 1010Ohm allows high source impedances to be used without degrading accuracy.

P-channel junction FET's are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1 µF hold capacitor. The JFET's have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design guarantees no feed-through from input to output in the hold mode, even for input signals equal to the supply voltages.

Reliability Metrics


Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
LF298H BIFET 0 12335 0 0 975000 4 276658912
LF298M BIFET 0 12335 0 0 975000 4 276658912
LF298MX BIFET 0 12335 0 0 975000 4 276658912

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.





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