LC89515K

Features:

• Software and pin compatibility with the LC8951 (Changes were made to internal registers, the SRAM interface, and other aspects.)
• Support for CD-ROM (mode 1) and CD-I (mode 2,forms 1 and 2)
• All CD-ROM/CD-I special functions implemented on a single chip
• Hardware error detection and correction for high speed, without relying on software
• Real-time error correction: Error correction and detection are possible without interrupting the host interface bus.
• Fast transfers: up to 2.3 MB/s (18.4 Mb/s)
• Support for low-speed hosts (multiple block buffering)
• Built-in host interface command FIFO (for easy SCSI support)
• Built-in 12-byte status FIFO
• CMOS circuits, single 5 V power supply


Pinout




Specifications

Parameter	Symbol	Conditions	Ratings	Unit
Maximum power supply voltage	VDD max	Ta = 25	0.3 to +7.0	V
I/O voltage	VI, VO	Ta = 25	0.3 to VDD+0.3	V
Allowable power dissipation	Pd max	Ta  70	350	mW
Operating temperature	Topr		30 to +70
Storage temperature	Tstg		55 to +125
Solder resistance (Pins only)		10 seconds	260

Description

The LC89515K is a version of the LC8951 in which certain aspects of the internal registers have been improved to make them even easier to use in CD-ROM and CD-I products. The basic blocks are identical to those in the LC8951 and these products are software and pin compatible. Thus this product can replace the LC8951 without change. (However, this product is provided in a slightly different package: a short lead type QIP-80E as opposed to the QIP-80A.)

The LC89515K is an error correction and host interface LSI for use in CD-ROM and CD-I products. This product integrate in a single chip all CD-ROM specific functions, including the error correction that was previously implemented in software on a microprocessor and the CD player and host computer interfaces that were previously implemented in discrete components or gate arrays. The use of the LSI can provide significant improvements in CD-ROM and CD-I players, including increased transfer
rates, miniaturization, increased reliability, an improved cost performance ratio, and a more efficient development period.