Features: Endstackable to 2.54 mm (0.1') spacing DC isolation test voltage VIO = 5 kV Low coupling capacitance of typical 0.3 pF Current Transfer Ratio (CTR) selected into groups Low temperature coefficient of CTR Wide ambient temperature range Underwriters Laboratory (UL) 1577 recognized,file num...
K827P: Features: Endstackable to 2.54 mm (0.1') spacing DC isolation test voltage VIO = 5 kV Low coupling capacitance of typical 0.3 pF Current Transfer Ratio (CTR) selected into groups Low temperature coe...
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Programmable logic controllers, modems, answering machines, general applications
Parameter | Test Conditions | Symbol | Value | Unit |
Reverse voltage | VR | 6 | V | |
Forward current | IF | 60 | mA | |
Forward surge current | tp 10 s | IFSM | 1.5 | A |
Power dissipation | Tamb 25 | PV | 100 | mW |
Junction temperature | Tj | 125 |
Parameter | Test Conditions | Symbol | Value | Unit |
Collector emitter voltage | VCEO | 70 | V | |
Emitter collector voltage | VECO | 7 | V | |
Collector current | IC | 50 | mA | |
Peak collector current | tp/T = 0.5, tp 10 ms | ICM | 100 | mA |
Power dissipation | Tamb 25 | PV | 150 | mW |
Junction temperature | Tj | 125 |
Coupler
Parameter Test | Conditions | Symbol | Value | Unit |
AC Isolation test voltage (RMS) | t = 1 min, f = 50 Hz | VIO1) | 5 | kV |
Total power dissipation | Tamb 25 | Ptot | 250 | mW |
Operating ambient temperature range |
Tamb | 40 to +100 | ||
Storage temperature range | Tstg | 55 to +125 | ||
Soldering temperature | 2 mm from case, t 10 s | Tsd | 260 |
The K817P/ K827PH/ K847PH consist of a phototransistor optically coupled to a gallium arsenide infrared-emitting diode in an 4-lead up to 16-lead plastic dual inline package.
The elements are mounted on one leadframe using a coplanar technique, providing a fixed distance between input and output for highest safety requirements.