ISL55142

Features:

• 18V I/O range
• 65MHz operation
• 9.5ns typical propagation delay
• Programmable input thresholds
• User defined comparator output levels
• Common-mode range includes negative rails
• Small footprints in QFN packages
• Power-down current <10A
• Pb-free plus anneal available (RoHS compliant)




Application

• Burn in ATE
• Low cost ATE
• Fast supervisory power control
• Instrumentation




Pinout






Specifications

V_CC to V_EE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 19V
Input Voltages
P_D, CV_AX, CV_BX, V_INPX, V_OH, V_OL
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . (V_EE -0.5V) to (V_CC +0.5V)
Output Voltage
Q_AX, Q_BX . . . . . . . . . . . . . . . . . . . . . (V_OL -0.5V) to (V_OH +0.5V)




Description

ISL55141, ISL55142, ISL55143 integrated circuits are high-speed, wide input common-mode range comparators. They provide three-state window comparators in a high voltage CMOS process (18V). Each comparator has dual receive thresholds, CVA and CVB, for establishing minimum 1-VIH and maximum 0-VIL voltage levels. These devices can accept inputs from a number of logic families, such as TTL, ECL, CMOS, LVCMOS, LVDS and CML. Two bits of output per comparator provide the test controller with qualification of a comparator input into three states. The two output bits work with a separate user supply to establish VOH, VOL levels compatibility with the systems controller logic levels. Fast propagation delay (9.5ns typical at 50mV overdrive) makes this family compatible with high-speed digital test systems. The 18V range enables the comparator input to operate over a wide input range. Two references per input enable and three state digitization of input with voltage swings of up to 13V common mode. The operating frequency of these devices is typically 65MHz. High voltage CMOS process makes these devices ideal for large voltage swing applications, such as special test voltages levels associated with Flash devices or power supervision applications and may avoid the need for test bus isolation relay(s).