Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Ceramic Package· Surface Mount· Light WeightSpecifications Parameter Units ID @ VGS = -12V, TC=25 Continuous Drain Curr...
IRHE9110: Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Ceramic Package· Surface Mount· Light WeightS...
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Features: ·Single Event Effect (SEE) Hardened·Ultra Low RDS(on)·Low Total Gate Charge·Proton Toler...
|
Parameter |
|
Units |
ID @ VGS = -12V, TC=25 |
Continuous Drain Current |
-2.3 |
A |
ID @ VGS = -12V, TC=100 |
Continuous Drain Current |
-1.5 | |
IDM |
Pulsed Drain Current |
-9.2 | |
PD @ TC = 25 |
Max. Power Dissipation |
15 |
W |
|
Linear Derating Factor |
0.1 |
W/ |
VGS |
Gate-to-Source Voltage |
±20 |
V |
EAS |
Single Pulse Avalanche Energy |
75 |
mJ |
IAR |
Avalanche Current |
-2.3 |
A |
EAR |
Repetitive Avalanche Energy |
1.5 |
mJ |
dv/dt |
Peak Diode Recovery dv/dt |
-12.5 |
V/ns |
TJ |
Operating Junction |
-55 to 150 |
|
|
Pckg. Mounting Surface Temp. |
300 (for 5s) | |
|
Weight |
0.42 (Typical) |
g |
International Rectifier's RAD-HardTM HEXFET® technology IRHE9110 provides high performance power MOSFETs for space applications. This technology has over a decade of proven performance and reliability in satellite applications. These devices IRHE9110 have been characterized for both Total Dose and Single Event Effects (SEE). The combination of low Rdson and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These devices IRHE9110 retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters.