IDT54FCT162511CT

Features: • 0.5 MICRON CMOS Technology• Typical tsk(o) (Output Skew) < 250ps, clocked mode• Low input and output leakage 1A (max)• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0)• Packages include 25 mil pitch SSOP, 19....

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IDT54FCT162511CT Picture
SeekIC No. : 004371736 Detail

IDT54FCT162511CT: Features: • 0.5 MICRON CMOS Technology• Typical tsk(o) (Output Skew) < 250ps, clocked mode• Low input and output leakage 1A (max)• ESD > 2000V per MIL-STD-883, Method 3...

floor Price/Ceiling Price

Part Number:
IDT54FCT162511CT
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/21

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Product Details

Description



Features:

• 0.5 MICRON CMOS Technology
• Typical tsk(o) (Output Skew) < 250ps, clocked mode
• Low input and output leakage 1A (max)
• ESD > 2000V per MIL-STD-883, Method 3015;
          > 200V using machine model (C = 200pF, R = 0)
• Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP,15.7 mil pitch TVSOP and 25 mil pitch Cerpack
• Extended commercial range of 40°C to +85°C
• VCC = 5V ±10%
• Balanced Output Drivers: ±24mA (commercial)
                                           ±16mA (military)
• Series current limiting resistors
• Generate/Check, Check/Check modes
• Open drain parity error allows wire-OR



Pinout

  Connection Diagram


Specifications

Symbol Rating
Max
Unit
VTERM Terminal Voltage with Respect to
GND
0.5 to +7.0
V
VTERM Terminal Voltage with Respect to
GND
0.5 to VCC +0.5
V
TSTG
Storage Temperature
65 to +150
°C
IOUT
DC Output Current
60 to +120
mA



Description

The IDT54FCT162511CT 16-bit registered/latched transceiver with parity is built using advanced dual metal CMOS technology.This high-speed, low-power transceiver combines D-type latches and D-type flip-flops to allow data flow in transparent,latched or clocked modes. The device has a parity generator/cheker in the A-to-B direction and a parity checker in the B-to-A direction. Error checking is done at the byte level with separate parity bits for each byte. Separate error flags exits for each direction with a single error flag indicating an error for either byte in the A-to-B direction and a second error flag indicating an error for either byte in the B-to-A direction.

The parity error flags of the IDT54FCT162511CT are open drain outputs which can be tied together and/or tied with flags from other devices to form a single error flag or interrupt. The parity error flags are enabled by the OExx control pins allowing the designer to disable the error flag during combinational transitions.The control pins LEAB, CLKAB and OEAB control operation in the A-to-B direction while LEBA, CLKBA and OEBA control the B-to-A direction. GEN/CHK is only for the selection of A-to-B operation, the B-to-A direction is always in checking mode. The ODD/EVEN select of the IDT54FCT162511CT is common between the two directions. Except for the ODD/EVEN control, independent operation can be achieved between the two directions by using the corresponding control lines.




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