HYB18T512800AF

The 512-Mbit DDR2 SDRAM offers the following key features:
• 1.8 V ± 0.1 V Power Supply
   1.8 V ± 0.1 V (SSTL_18) compatible I/O
• DRAM organisations with 4, 8 and 16 data in/outputs
• Double Data Rate architecture: two data transfers per clock cycle, four internal banks for concurrent operation
• CAS Latency: (2), 3, 4 and 5
• Burst Length: 4 and 8
• Differential clock inputs (CK and CK)
• Bi-directional, differential data strobes (DQS and DQS) are transmitted / received with data. Edge aligned with read data and center-aligned with write data.
• DLL aligns DQ and DQS transitions with clock
• DQS can be disabled for single-ended data strobe operation
• Commands entered on each positive clock edge,data and data mask are referenced to both edges of DQS
• Data masks (DM) for write data
• Posted CAS by programmable additive latency for better command and data bus efficiency
• Off-Chip-Driver impedance adjustment (OCD) and On-Die-Termination (ODT) for better signal quality.
• Auto-Precharge operation for read and write bursts
• Auto-Refresh, Self-Refresh and power saving Power-Down modes
• Average Refresh Period 7.8 s
• Full and reduced Strength Data-Output Drivers
• 1K page size for *4 & *8, 2K page size for *16
• Packages:
P-TFBGA-60 for *4 & *8 components
P-TFBGA-84 for *16 components
• RoHS Compliant Products1)

1) Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2) V_DD, V_DDQ and V_DDL must be within 300 mV of each other at all times, and V_REF must not be greater than 0.6 x V_DDQ. However when V_DD, V_DDQ and V_DDL are less than 500 mV, V_REF may be equal to or less than 300 mV.
3) Storage Temperature is the case surface temperature on the center/top side of the DRAM.

The 512-Mb DDR2 DRAM HYB18T512800AF is a high-speed Double-Data-Rate-2 CMOS Synchronous DRAM device containing 536,870,912 bits and internally configured as a quad-bank DRAM. The 512-Mb device is organized as either 32 Mbit × 4 I/O × 4 banks, 16 Mbit × 8 I/O × 4 banks or 8 Mbit × 16 I/O × 4 banks chip.These synchronous devices achieve high speed transfer rates starting at 400 Mb/sec/pin for general applications. See Table 3 for performance figures.

The device HYB18T512800AF is designed to comply with all DDR2 DRAM key features:
1. posted CAS with additive latency,
2. write latency = read latency - 1,
3. normal and weak strength data-output driver,
4. Off-Chip Driver (OCD) impedance adjustment
5. On-Die Termination (ODT) function.

All of the HYB18T512800AF control and address inputs are synchronized with a pair of externally supplied differential clocks.Inputs are latched at the cross point of differential clocks (CK rising and CK falling). All I/Os are synchronized with a single ended DQS or differential DQS-DQS pair in a source synchronous fashion.A 16-bit address bus for ×4 and ×8 organised components and a 15-bit address bus for ×16 components is used to convey row, column and bank address information in a RAS-CAS multiplexing style.

The DDR2 device HYB18T512800AF operates with a 1.8 V ± 0.1 V power supply. An Auto-Refresh and Self-Refresh mode is provided along with various power-saving power-down modes.

The functionality described and the timing specifications included in this data sheet are for the DLL Enabled mode of operation. The DDR2 SDRAM HYB18T512800AF is available in P-TFBGA package.