Features: • 1.8V ± 0.1V Power Supply1.8 V ± 0.1V (SSTL_18) compatible) I/O• DRAM organisations with 4, 8 and 16 data in/outputs• Double Data Rate architecture: two data transfers perclock cycle, four internal banks for concurrent operation• CAS Latency: 3, 4 and 5• Bu...
HYB18T256800AF: Features: • 1.8V ± 0.1V Power Supply1.8 V ± 0.1V (SSTL_18) compatible) I/O• DRAM organisations with 4, 8 and 16 data in/outputs• Double Data Rate architecture: two data transfers p...
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• 1.8V ± 0.1V Power Supply
1.8 V ± 0.1V (SSTL_18) compatible) I/O
• DRAM organisations with 4, 8 and 16 data in/outputs
• Double Data Rate architecture: two data transfers per
clock cycle, four internal banks for concurrent operation
• CAS Latency: 3, 4 and 5
• Burst Length: 4 and 8
• Differential clock inputs (CK and CK)
• Bi-directional, differential data strobes (DQS and
DQS) are transmitted / received with data. Edge
aligned with
read data and center-aligned with write data
• DLL aligns DQ and DQS transitions with clock
• DQS can be disabled for single-ended data strobe
operation
• Commands entered on each positive clock edge, data
and data mask are referenced to both edges of DQS
• Data masks (DM) for write data
• Posted CAS by programmable additive latency for
better command and data bus efficiency
• Off-Chip-Driver impedance adjustment (OCD) and
On-Die-Termination (ODT) for better signal quality.
• Auto-Precharge operation for read and write bursts
• Auto-Refresh, Self-Refresh and power saving Power-
Down modes
• Average Refresh Period 7.8µs at a TCASE lower than
85oC, 3.9µs between 85oC and 95oC
• Normal and Weak Strength Data-Output Drivers
• 1k page size
• Lead-freePackages:
60 pin FBGA for x4 & x8 components
84 pin FBPA for x16 components
Symbol | Parameter | Rating | Units | Notes |
VDD | Voltage on VDD pin relative to VSS | -1.0 to + 2.3 | V | 1 |
VDDQ | Voltage on VDDQ pin relative to VSS | -0.5 to + 2.3 | V | 1 |
VDDL | Voltage on VDDL pin relative to VSS | -0.5 to + 2.3 | V | 1 |
VIN, VOUT | Voltage on any pin relative to VSS | -0.5 to + 2.3 | V | 1 |
TSTG | Storage Temperature | -55 to + 100 | 1, 2 |
The 256Mb Double-Data-Rate-2 (DDR2) DRAMs HYB18T256800AF are highspeed CMOS Double Data Rate 2 Synchronous DRAM devices containing 268,435,456 bits and are internally configured as a quad-bank DRAMs. The 256Mb chip is organized as either 16Mbit x 4 I/O x 4 bank, 8Mbit x 8 I/O x 4 bank or 4Mbit x 16 I/O x 4 bank device. These synchronous devices achieve high speed double-data-rate transfer rates of up to 667 Mb/sec/pin for general applications.
The chip HYB18T256800AF is designed to comply with all key DDR2 DRAM key features: (1) posted CAS with additive latency, (2) write
latency = read latency -1, (3) normal and weak strength dataoutput driver, (4) Off-Chip Driver (OCD) impedance adjustment and (5) an ODT (On-Die Termination) function.
All of the HYB18T256800AF control and address inputs are synchronized with a pair of externally supplied differential clocks. Inputs are latched at the cross point of differential clocks (CK rising and CK falling). All I/Os are synchronized with a single
ended DQS or differential (DQS, DQS) pair in a source synchronous fashion. A 15 bit address bus is used to convey
row, column and bank address information in a RAS / CAS multiplexing style.
The DDR2 devices HYB18T256800AF operate with a 1.8V +/-0.1V power supply and are available in FBGA packages.
An Auto-Refresh and Self-Refresh mode is provided by HYB18T256800AF along with various power-saving power-down modes.
The functionality described and the timing specifications
included in this data sheet are for the DLL Enabled mode
of operation.