Application·Small footprint due to a small and thin package ·High DC current gain : hFE= 200 to 500 (IC = 0.12 A)·Low collector-emitter saturation: PNP VCE(sat)= 0.20 V (max) : NPN VCE (sat) = 0.17 V (max)·High-speed switching : PNP tf= 45 ns (typ.) : NPN tf= 50 ns (typ.) PinoutSpecifications ...
HN4B101J: Application·Small footprint due to a small and thin package ·High DC current gain : hFE= 200 to 500 (IC = 0.12 A)·Low collector-emitter saturation: PNP VCE(sat)= 0.20 V (max) : NPN VCE (sat) = 0.17...
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Characteristic |
Symbol |
Rating |
Unit | ||
PNP | NPN | ||||
Collector-base voltage Collector-emitter voltage Emitter-base voltage |
VCBO VCES VEBO |
-30 -30 -7 |
50 30 7 |
V V V | |
Collector current |
DC (Note1) |
IC |
-1.0 |
1.2 |
A |
Pulse (Note1) |
ICP |
-5.0 |
5.0 | ||
Base current |
IB |
-120 |
120 |
A | |
Collector power dissipation (t=10s) |
Single-device operation |
PC(Note2) |
0.85 |
W | |
Collector power dissipation (DC) |
Single-device operation |
PC(Note2) |
0.55 |
W | |
Junction temperature Storage temperature range |
Tj Tstg |
150 -55 to 150 |
Note 1: Ensure that the channel temperature does not exceed 150!aC during use of the device.
Note 2: Mounted on an FR4 board (glass-epoxy; 1.6 mm thick; Cu area, 645 mm2)
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) anindividual reliability data (i.e. reliability test report and estimated failure rate, etc).