Features: Security• Encrypted storage of manufacturer's code• Encrypted storage of encoder keys• Up to seven transmitters can be learned• KEELOQ code hopping technology• Normal and secure learning mechanismsOperating• 3.0V-5.5V operation• Internal oscillat...
HCS500: Features: Security• Encrypted storage of manufacturer's code• Encrypted storage of encoder keys• Up to seven transmitters can be learned• KEELOQ code hopping technology•...
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Parameter Name | Value |
Reception Length Bits | 66 |
Operating Voltage (V) | 3.0 to 5.5 |
Decoder Functions S0 | S0, 15 Serial Functions |
Other Features | Full-featured decoder with serial interface to microcontrollers |
Transmitters Supported | Up to 7 |
Encoders Supported | HCS200, HCS201, HCS300, HCS301, HCS320, HCS360, HCS361, HCS362, HCS365, HCS370, HCS410, HCS412, HCS473 |
Ambient temperature under bias........................................-40°C to +85°C
Storage temperature ...................................................... -65°C to +150°C
Voltage on any pin with respect to VSS (except VDD)...... -0.6V to VDD +0.6V
Voltage on VDD with respect to Vss.............................................. 0 to +7.0V
Total power dissipation (Note) ........................................................ 700 mW
Maximum current out of VSS pin ....................................................... 200 mA
Maximum current into VDD pin .......................................................... 150 mA
Input clamp current, IIK (VI < 0 or VI > VDD) ...................................± 20 mA
Output clamp current, IOK (VO < 0 or VO >VDD) ..............................± 20 mA
Maximum output current sunk by any I/O pin...................................... 25 mA
Maximum output current sourced by any I/O pin................................. 25 mA
Note: Power dissipation is calculated as follows: PDIS = VDD x {IDD - IOH} + {(VDDVOH) x IOH} + (VOl x IOL)
NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.