HCS373T

Features:

• QML Class T, Per MIL-PRF-38535
• Radiation Performance
- Gamma Dose () 1 x 10⁵ RAD(Si)
- Latch-Up Free Under Any Conditions
- SEP Effective LET No Upsets: >100 MEV-cm²/mg
- Single Event Upset (SEU) Immunity < 2 x 10^-9 Errors/Bit-Day (Typ)
• 3 Micron Radiation Hardened CMOS SOS
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- V_IL = 0.3 V_CC Max
- V_IH = 0.7 V_CC Min
• Input Current Levels Ii 5mA at V_OL, V_OH


Pinout




Description

Intersil's Satellite Applications FlowTM (SAF) HCS373T devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability.

The Intersil HCS373T is a Radiation Hardened Octal Transparent Three-State Latch with an active-low output enable. The HCS373T utilizes advanced CMOS/SOS technology. The outputs are transparent to the inputs when the Latch Enable (LE) is HIGH. When the Latch Enable (LE) goes LOW, the data is latched. The Output Enable (OE) controls the three-state outputs. When the Output Enable (OE) is HIGH, the outputs are in the high impedance state. The latch operation is independent of the state of the Output Enable.