HCPL-560K

Current Transfer Ratio :
Maximum Input Diode Current :
Packaging :
Maximum Reverse Diode Voltage : 5 V
Maximum Forward Diode Voltage : 1.9 V
Minimum Operating Temperature : - 55 C
Maximum Baud Rate : 10 MBps
Maximum Operating Temperature : + 125 C
Package / Case : PDIP-8
Maximum Power Dissipation : 200 mW


Description

The HCPL-560K is a highest reliability Class K single channel hermetically sealed optocoupler in a 8-Pin ceramic DIP package with gold plated leads. Solder dipped leads and various lead form options are also available. See the datasheet for details.
The HCPL-560K is capable of operation and storage over the full military temperature range and may also be purchased as either commercial grade, MIL-PRF-38534 Class Level H or K testing from the DSCC SMD 5962-90855. The HCPL-560K is manufactured and tested on a MIL-PRF-38534 certified line and is included in the DSCC Qualified Manufacturers List QML-38534 for Hybrid Microcircuits. Quad channel devices are available by special order in the 16-Pin DIP through-hole packages.
The HCPL-560K contains a GaAsP light emitting diode which is optically coupled to an integrated high speed photon detector. The output of the detector is an open collector Schottky clamped transistor. Internal shields provide a guaranteed common mode transient immunity specification of 1000 V/micro-second. For Isolation Voltage applications requiring up to 2500 Vdc, the HCPL-5650 family is also available. Package styles for this die set in one, two, or four channels are 8 and 16-Pin DIP through hole, 16-Pin surface mount DIP flat pack, and 20 pad Leadless Ceramic Chip Carrier. Most devices may be purchased with a variety of lead forms and plating options. See the datasheet for details.
Because the same electrical die (emitters and detectors) are used for each channel of each HCPL-560K device listed in the datasheet, absolute maximum ratings, recommended operating conditions, electrical specifications, and performance characteristics shown in the datasheet figures are virtually identical for all parts. Occasional exceptions exist due to package variations and limitations and are as noted. Additionally, the same package assembly processes and materials are used in all devices. These similarities give justification for the use of data obtained from one part to represent other parts performance for reliability and certain limited radiation test results.