Features: •FT pin for user configurable flow through or pipelined operation.• Dual Cycle Deselect (DCD) Operation.• 3.3V +10%/-5% Core power supply• 2.5V or 3.3V I/O supply.•LBO pin for linear or interleaved burst mode.• Internal input resistors on mode pins all...
GS840E32: Features: •FT pin for user configurable flow through or pipelined operation.• Dual Cycle Deselect (DCD) Operation.• 3.3V +10%/-5% Core power supply• 2.5V or 3.3V I/O supply.&...
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Features: •FT pin for user configurable flow through or pipelined operation.• Single C...
The GS840E18/32/36 is a 4,718,592 bit (4,194,304 bit for x32 version) high performance synchronous SRAM with a 2 bit burst address counter. Although of a type originally developed for Level 2 Cache applications supporting high performance CPU's, the device now finds application in synchronous SRAM applications ranging from DSP main store to networking chip set support. The GS840E18/32/36 is available in a JEDEC standard 100-lead TQFP or 119 Bump BGA package
Symbol | Description | Value | Unit |
VDD | Voltage on VDD Pins | -0.5 to 4.6 | V |
VDDQ | Voltage in VDDQ Pins | -0.5 to VDD | V |
VCK | Voltage on Clock Input Pin | -0.5 to 6 | V |
VI/O | Voltage on I/O Pins | -0.5 to VDDQ+0.5 ( 4.6 V max.) | V |
VIN | Voltage on Other Input Pins | -0.5 to VDD+0.5 ( 4.6 V max.) | V |
IIN | Input Current on Any Pin | +/- 20 | mA |
IOUT | Output Current on Any I/O Pin | +/- 20 | mA |
PD | Package Power Dissipation | 1.5 | W |
TSTG | Storage Temperature | -55 to 125 | |
TBIAS | Temperature Under Bias | -55 to 125 |