DescriptionThe GR500 is designed as one kind of graded reliability concept has made available state-of-theart devices providing maximum assurance of meeting system reliability goals.It has many series such as the T210 series, T240 series. And all GR500 series capacitors are subjected to a broad te...
GR500: DescriptionThe GR500 is designed as one kind of graded reliability concept has made available state-of-theart devices providing maximum assurance of meeting system reliability goals.It has many seri...
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The GR500 is designed as one kind of graded reliability concept has made available state-of-theart devices providing maximum assurance of meeting system reliability goals.It has many series such as the T210 series, T240 series. And all GR500 series capacitors are subjected to a broad test program. Despite the most rigid of quality control procedures, some variation among batches of capacitors must be recognized.
Each GR500 Series capacitor is tested at 25°C for leakage current at rated voltage, as well as capacitance and dissipation factor at 120 Hz. Since uniformity is generally a valid indicator of reliability, parametric distributions are graphically recorded for each lot. Parts which deviate from the normal population are discarded.If you want to know more information such as the electrical characteristics about the GR500,please download the datasheet in www.seekic.com or www.chinaicmart.com.
Grading consists of placing GR500 capacitors in an oven at 85°C for a minimum of 250 hours at a voltage greater than rated voltage. The technique is fundamentally based upon the oft-documented fact that solid tantalum capacitors do not conform to the exponential distribution of time-ordered failures, but instead exhibit a constantly decreasing failure rate. The Weibull distribution provides a valuable tool for describing the behavior of solid tantalum capacitors, and experimental fits are made to this distribution in determining performance levels for each GR500 Series batch. Actual test data are provided with each shipment of capacitors to document the failure rate obtained.