Features: ·Non Punch Through Silicon·Isolated Copper Baseplate·Low Inductance Internal ConstructionSpecificationsStresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme conditions, as with all semiconductors, this may include potentially ha...
GP200MHS12: Features: ·Non Punch Through Silicon·Isolated Copper Baseplate·Low Inductance Internal ConstructionSpecificationsStresses above those listed under 'Absolute Maximum Ratings' may cause permanent dama...
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Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability.
Tcase = 25°C unless stated otherwise
Symbol |
Parameter |
Test Conditions |
Max. |
Units |
VCES | Collector-emitter voltage |
VGE = 0V |
1200 |
V |
VGES | Gate-emitter voltage |
- |
±20 |
V |
IC | Continuous collector current |
DC, Tcase = 72°C |
200 |
A |
IC(PK) | Peak collector current |
1ms, Tcase = 72°C |
400 |
A |
Pmax | Max. power dissipation |
Tcase = 25°C Tj = 150°C |
1490 |
W |
Visol | Isolation voltage |
Commoned terminals to base plate. AC RMS, 1 min, 50Hz |
2500 |
V |