Features: • 25A, 60V, rDS(ON) = 0.020• Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si)• Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity for LET of 36MeV/mg/cm2 with VDS up to 80% of Rated Breakdown and VGS of 10V Off-Bias• Dose Ra...
FSF055D: Features: • 25A, 60V, rDS(ON) = 0.020• Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si)• Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity ...
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FSF055D, FSF055R | UNITS | ||
Drain-Source Voltage | VDS |
60 |
V |
Drain-Gate Voltage (RGS = 20k). | VDGR |
60 |
V |
Continuous Drain Current TC = 25 TC = 100 |
ID ID |
25 25 |
A A |
Pulsed Drain Current | IDM |
200 |
A |
Gate-Source Voltage | VGS |
±20 |
V |
Maximum Power Dissipation TC = 25 TC = 100 |
PT PT |
125 50 |
W W |
Linear Derating Factor |
1.14 |
W/ | |
Single Pulsed Avalanche Current,L = 100H, (See Test Figure) | IAS |
200 |
A |
Continuous Source Current (Body Diode) | IS |
25 |
A |
Pulsed Source Current (Body Diode) | ISM |
200 |
A |
Operating And Storage Temperature | TJ, TSTG |
-55 to +150 |
|
Lead Temperature (During Soldering) Distance > 0.063 in. (1.6mm) From Case, 10s Max |
TL |
300 |
The Discrete Products Operation of Intersil Corporation FSF055D has developed a series of Radiation Hardened MOSFETs specifically designed for commercial and military space applications. Enhanced Power MOSFET immunity to Single Event Effects (SEE), Single Event Gate Rupture (SEGR) in particular, is combined with 100K RADS of total dose hardness to provide FSF055D are ideally suited to harsh space environments.The dose rate and neutron tolerance necessary for military applications have not been sacrificed.
The Intersil portfolio of SEGR resistant radiation hardened MOSFETs includes N-Channel and P-Channel FSF055D in a variety of voltage, current and on-resistance ratings. Numerous packaging options are also available.
This MOSFET FSF055D is an enhancement-mode silicon-gate power field-effect transistor of the vertical DMOS (VDMOS) structure. FSF055D is specially designed and processed to be radiation tolerant. The MOSFET is well suited for applications exposed to radiation environments such as switching regulation, switching converters, motor drives, relay drivers and drivers for high-power bipolar switching transistors requiring high speed and low gate drive power. This type can be operated directly from integrated circuits.
Reliability screening of FSF055D is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet.