Features: • 7A, 200V, RDS(on) = 0.515• Second Generation Rad Hard MOSFET Results From New Design Concepts• Gamma- Meets Pre-Rad Specifications to 100KRAD(Si) - Defined End Point Specs at 300KRAD(Si) and 1000KRAD(Si) - Performance Permits Limited Use to 3000KRAD(Si)• Gamma D...
FRS230H: Features: • 7A, 200V, RDS(on) = 0.515• Second Generation Rad Hard MOSFET Results From New Design Concepts• Gamma- Meets Pre-Rad Specifications to 100KRAD(Si) - Defined End Point Sp...
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Features: `High Speed trr 100ns`IF(AV)200A`Isolated Mounting base.`High Surge CapabilityApplicatio...
Features: `High Speed trr 100ns`IF(AV)200A`Isolated Mounting base.`High Surge CapabilityApplicatio...
Features: High Speed trr350nsIF(AV) 200AIsolated Mounting base.High Surge CapabilityApplicationInv...
FRS230D, R, H | UNITS | ||
Drain-Source Voltage | VDS |
200 |
V |
Drain-Gate Voltage (RGS = 20k). | VDGR |
200 |
V |
Continuous Drain Current TC = +25 TC = +100 |
ID ID |
7 4 |
A A |
Pulsed Drain Current | IDM |
21 |
A |
Gate-Source Voltage | VGS |
±20 |
V |
Maximum Power Dissipation TC = +25 TC = +100 |
PT PT |
50 20 |
W W |
Derated Above +25 |
0.40 |
W/ | |
Inductive Current, Clamped, L = 100H, (See Test Figure) | ILM |
21 |
A |
Continuous Source Current (Body Diode) | IS |
7 |
A |
Pulsed Source Current (Body Diode) | ISM |
21 |
A |
Operating And Storage Temperature | TJC, TSTG |
-55 to +150 |
|
Lead Temperature (During Soldering) | |||
Distance > 0.063 in. (1.6mm) From Case, 10s Max | TL |
300 |
The Intersil Corporation FRS230H has designed a series of SECOND GENERATION hardenedpower MOSFETs of both N and P channel enhancement types with ratingsrom 100V to 500V, 1A to 60A, and on resistance as low as 25mW. Total dosehardness FRS230H is offered at 100K RAD(Si) and 1000KRAD(Si) with neutron hardnessranging from 1E13n/cm2 for 500V product to 1E14n/cm2 for 100V product. Doserate hardness (GAMMA DOT) exists for rates to 1E9 without current limiting and2E12 with current limiting.
This MOSFET FRS230H is an enhancement-mode silicon-gate power field effect transistor ofthe vertical DMOS (VDMOS) structure. FRS230H is specially designed and processed toexhibit minimal characteristic changes to total dose (GAMMA) and neutron (no)exposures. Design and processing efforts are also directed to enhance survival toheavy ion (SEE) and/or dose rate (GAMMA DOT) exposure.
FRS230H may be supplied as a die or in various packages other than shown above. eliability screening is available as either non TX (commercial), TX equivalent of IL-S-19500, TXV equivalent of MIL-S-19500, or space equivalent of IL-S-19500. Contact the Intersil High-Reliability Marketing group for any desired eviations from the data sheet.