FDP6035L

MOSFET N-Ch PowerTrench Logic

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SeekIC No. : 00164910 Detail

FDP6035L: MOSFET N-Ch PowerTrench Logic

floor Price/Ceiling Price

Part Number:
FDP6035L
Mfg:
Fairchild Semiconductor
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/21

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Product Details

Quick Details

Transistor Polarity : N-Channel Drain-Source Breakdown Voltage : 30 V
Gate-Source Breakdown Voltage : +/- 20 V Continuous Drain Current : 58 A
Resistance Drain-Source RDS (on) : 0.011 Ohms Configuration : Single
Maximum Operating Temperature : + 175 C Mounting Style : Through Hole
Package / Case : TO-220 Packaging : Tube    

Description

Transistor Polarity : N-Channel
Gate-Source Breakdown Voltage : +/- 20 V
Configuration : Single
Maximum Operating Temperature : + 175 C
Drain-Source Breakdown Voltage : 30 V
Mounting Style : Through Hole
Packaging : Tube
Package / Case : TO-220
Continuous Drain Current : 58 A
Resistance Drain-Source RDS (on) : 0.011 Ohms


Features:

*58 A, 30 V. RDS(ON)   = 0.011 @ VGS =10 V          
                    RDS(ON)  = 0.019 @ VGS =4.5 V.      
*Low  gate charge (typical 34 nC).
*Low Crss (typical 175 pF).
*Fast switching speed.



Specifications

Symbol Parameter FDP6035L FDB6035L Units
VDSS Drain-Source Voltage 30 V
VGSS Gate-Source Voltage ±20 V
ID Drain Current - Continuous
- Pulsed
58 A
175
PD Maximum Power Dissipation @ TC = 25
Derate above 25
75 W
0.5 W/
TJ, TSTG Operating and Storage Temperature Range -65 to 175



Description

  These FDP6035L N-Channel logic level enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. These devices FDP6035L are particularly suited for low voltage applications such as DC/DC converters and high efficiency switching circuits where fast switching, low in-line power loss, and resistance to transients are needed.




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