EDS2532AABJ-75

Features: • 3.3V power supply• Clock frequency: 133MHz (max.)• Single pulsed /RAS• ×32 organization• 4 banks can operate simultaneously and independently• Burst read/write operation and burst read/single write operation capability• Programmable burst lengt...

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EDS2532AABJ-75 Picture
SeekIC No. : 004333901 Detail

EDS2532AABJ-75: Features: • 3.3V power supply• Clock frequency: 133MHz (max.)• Single pulsed /RAS• ×32 organization• 4 banks can operate simultaneously and independently• Burst r...

floor Price/Ceiling Price

Part Number:
EDS2532AABJ-75
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

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evaluate  (4.8 stars)

Upload time: 2024/11/24

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Product Details

Description



Features:

• 3.3V power supply
• Clock frequency: 133MHz (max.)
• Single pulsed /RAS
• ×32 organization
• 4 banks can operate simultaneously and independently
• Burst read/write operation and burst read/single write operation capability
• Programmable burst length (BL): 1, 2, 4, 8 and full page
• 2 variations of burst sequence
-Sequential (BL = 1, 2, 4, 8, full page)
-Interleave (BL = 1, 2, 4, 8)
• Programmable /CAS latency (CL): 2, 3
• Byte control by DQM
• Address
-4K Row address /512 column address
• Refresh cycles
-4096 refresh cycles/64ms
• 2 variations of refresh
-Auto refresh
-Self refresh
• FBGA package with lead free solder (Sn-Ag-Cu)



Pinout

  Connection Diagram


Specifications

Parameter

Symbol

Rating

Unit

Voltage on any pin relative to VSS
VT
0.5 to VDD + 0.5 ( 4.6 (max.))
V
Supply voltage relative to VSS
VDD
0.5 to +4.6
V
Short circuit output current
IOS
50
mA
Power dissipation
PD
1.0
W
Operating temperature
TA
40 to +85
°C

Storage temperature

Tstg
55 to +125
°C

Caution
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.




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