AS4LC1M16

Features: • JEDEC- and industry-standard x16 timing, functions, pinouts and packages• High-performance CMOS silicon-gate process• Single +3.3V ±0.3V power supply• All device pins are TTL-compatible• Refresh modes: RAS ONLY, CAS-BEFORE-RAS (CBR), HIDDEN• BYTE WRI...

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SeekIC No. : 004288366 Detail

AS4LC1M16: Features: • JEDEC- and industry-standard x16 timing, functions, pinouts and packages• High-performance CMOS silicon-gate process• Single +3.3V ±0.3V power supply• All device ...

floor Price/Ceiling Price

Part Number:
AS4LC1M16
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Description



Features:

• JEDEC- and industry-standard x16 timing, functions, pinouts and packages
• High-performance CMOS silicon-gate process
• Single +3.3V ±0.3V power supply
• All device pins are TTL-compatible
• Refresh modes: RAS ONLY, CAS-BEFORE-RAS (CBR), HIDDEN
• BYTE WRITE access cycles
• 1,024-cycle refresh (10 row-, 10 column-addresses)
• Low power, 0.3mW standby; 180mW active, typical
• Extended Data-Out (EDO) PAGE access cycle
• 5V-tolerant I/Os (5.5V maximum VIH level)



Pinout

  Connection Diagram


Specifications

Voltage on VCC pin Relative to VSS .............. -1.0V to +4.6V
Voltage on NC, Inputs or I/O pins
Relative to Vss ................................................................. -1.0V to +5.5V
Operating Temperature, TA (ambient) .............................. TA(MIN)=-55°C
    ...................................................................................... TC(MAX)=125°C
Storage Temperature ....................................................... -55°C to +150°C
Power Dissipation ............................................................. 1W
Short Circuit Output Current ............................................. 50mA

*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.



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