ADS7818E

PinoutDescriptionThe ADS7818E is a 12-bit sampling analog-to-digital converter (A/D) complete with sample/hold, internal 2.5V reference, and synchronous serial interface. Features of the ADS7818E are:(1)500kHz throughput rate;(2)2.5 internal reference;(3)low power is 11 mW;(4)single supply +5V o...

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SeekIC No. : 004277210 Detail

ADS7818E: PinoutDescriptionThe ADS7818E is a 12-bit sampling analog-to-digital converter (A/D) complete with sample/hold, internal 2.5V reference, and synchronous serial interface. Features of the ADS7818E ...

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Part Number:
ADS7818E
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/24

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Description

The ADS7818E is a 12-bit sampling analog-to-digital converter (A/D) complete with sample/hold, internal 2.5V reference, and synchronous serial interface.

Features of the ADS7818E are:(1)500kHz throughput rate;(2)2.5 internal reference;(3)low power is 11 mW;(4)single supply +5V operation;(5)differential input;(6)serial interface;(7)guaranteed no missing codes;(8)mini-DIP-8 and MSOP-8;(9)unipolar input range.

The absolute maximum ratings of the ADS7818E can be summarized as:(1):the parameter is Vcc to GND,the rating is -0.3 to 6,the unit is V;(2):the parameter is analog input to GND,the rating is -0.3 to (Vcc+0.3),the unit is V;(3):the parameter is digital input to GND,the rating is -0.3 to (Vcc+0.3),the unit is V;(4):the parameter is power dissipation,the rating is 325,the unit is mW;(5):the parameter is maximum junction temperature,the rating is +150,the unit is ;(6):the parameter is operating temperature,the rating is -40 to +85,the unit is ;(7):the parameter is storage temperature,the rating is -65 to +150,the unit is ;(7):the parameter is lead temperature (soldering, 10s),the rating is +300,the unit is .Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability.




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