Features: 650 mA Voltage Programmable Current RangeThree Selectable Gain Ranges1.7 ns Propagation DelayInhibit Mode FunctionHigh Speed Differential Inputs for Maximum FlexibilityUltrasmall 20-Lead PSOP Package with Built-In Hea
ApplicationAutomatic Test EquipmentSemiconductor Test SystemsBoard Test SystemsPinout
Specifications+VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. +12 V
VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . 7 V
+VS to VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +17 V
GND to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . .. . ±0.4 V
Inputs
INH, INH . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . .. . +6 V, 3 V
INH to INH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. .. . ±3 V
GAINA, GAINB . . . . . . . . . . . . . . . . . . . . . . . .. . .. . . +6 V, 3 V
GAINA to GAINB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. .±5 V
VCOMIN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8 V, 3 V
IOHPGM, IOLPGM . . . . . . . . . . . . . . . . . . . . . . . . . +6 V, 1 V
Outputs
IOHOUT, IOHRTN . . . . . . . . . . . . . . . . . . . . . . . . +9 V, 2.5 V
IOLOUT, IOLRTN . . . . . . . . . . . . . . . . . . . . . . . . . +8 V, 3.5 V
VCOMOUT Short Circuit Duration . . . . . . . . . . .Not Protected2
Environmental
Operating Temperature (Junction) . . . . . . . . . . . . . . ..+175
Storage Temperature . . . . . . . . . . . . . . . .. . 65 to +150
Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . .. +260DescriptionThe AD53041 is a complete, high speed, current switching loaddesigned for use in linear, digital or mixed signal test systems.Combining a high speed monolithic process with a unique surfacemount package, this product attains superb electrical performancewhile preserving optimum packaging densities in anultrasmall 20-lead, PSOP package with a built-in heatsink.
Featuring current programmability of up to ±50 mA, theAD53041 is designed to force the device under test to sourceor sink the programmed IOH and IOL currents. IOH and IOLcurrents are determined by applying a corresponding voltage(5 V = 50 mA, 16 mA, 5 mA) to the IOHPGM and IOLPGM pins.The voltage-to-current conversion is performed within theAD53041, thus allowing the current levels to be set by a standardvoltage out digital-to-analog converter.
The AD53041 transition from IOH to IOL occurs when the outputvoltage of the device under test slews above or below theprogrammed threshold or commutation voltage. The commutationvoltage is programmable from 2 V to +7 V, covering thelarge spectrum of logic devices while able to support the largecurrent specifications (48 mA) typically associated with linedrivers. To test I/O devices,the active load can be switched intoa high impedance state (Inhibit Mode), electrically removing theactive load from the path through the Inhibit Mode feature. Theactive load leakage current in Inhibit is typically 100 nA.
The Inhibit input circuitry is implemented using high speeddifferential inputs with a common-mode voltage range of2 V to +3 V and a maximum differential voltage of 3 V. Thisallows for direct interface to precision differential ECL timing orthesimplicity of switching active load from a single ended TTLor CMOS logic source. With switching speeds from IOH or IOLinto Inhibit of lessthan 2.0 ns, the AD53041 can be electricallyremoved from the signal path "on the fly."
AD53041 Data Sheet
